• DocumentCode
    2558585
  • Title

    Semi-analytic solution of the plane discharge with warm ions

  • Author

    Jelic, Nikola ; Kos, Leon ; Duhovnik, Jozef

  • Author_Institution
    Assoc. EURATOM-OAW, Univ. of Innsbruck, Innsbruck, Austria
  • fYear
    2012
  • fDate
    8-13 July 2012
  • Abstract
    Summary form only given. The problem of plane collision-free discharge is an old important one, which has been defined and solved with ions born at rest almost one century ago by Tonks and Langmuir. After decades the first attempts to solve this problem also for the case of ions born with a finite temperature resulted in a numerical solution of Bissell and Johnson, which however, was valid only in a narrow range of the ion-source temperatures. A highly reliable, i.e., exact numerical solution valid for arbitrary ion source temperature on a high resolution non-uniform grid was obtained by Kos et al. and later on an analytic solution, expressed in an implicit form, which contains straightforward but not-tabulated integrals, so still is not practical to be implemented as a cost-effective numerical subroutine in other codes, e.g., for calculating the self-consistent plasma boundary conditions. In this work we go a step ahead and present a new explicit solution for the kernel of the problem i.e., the potential profile of the discharge. Comparison with the exact solution of Kos et al., shows an surprisingly good agreement obtained by both methods for enough high ion source temperatures.
  • Keywords
    discharges (electric); numerical analysis; plasma temperature; plasma transport processes; Bissell-Johnson numerical solution; discharge potential profile; high resolution nonuniform grid; ion source temperature; plane collision free discharge; plane discharge semianalytic solution; self consistent plasma boundary conditions; warm ions; Discharges (electric); Educational institutions; Ion sources; Plasma temperature; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
  • Conference_Location
    Edinburgh
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4577-2127-4
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2012.6383571
  • Filename
    6383571