DocumentCode :
2558694
Title :
Reducing Cycle Times Through Advanced Design Tools
Author :
Parmer, C. ; Laney, S.
Author_Institution :
Micron Technology, Inc.
fYear :
1992
fDate :
2-4 June 1992
Firstpage :
346
Lastpage :
347
Keywords :
Circuit testing; Design engineering; Design for testability; Guidelines; Lead; Printed circuits; Prototypes; Reliability engineering; Semiconductor device manufacture; Surface-mount technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics, 1992. Digest of Technical Papers. ICCE., IEEE 1992 International Conference on
Conference_Location :
Rosemont, IL, USA
Print_ISBN :
0-7803-0479-9
Type :
conf
DOI :
10.1109/ICCE.1992.697255
Filename :
697255
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2558694
