DocumentCode
2558694
Title
Reducing Cycle Times Through Advanced Design Tools
Author
Parmer, C. ; Laney, S.
Author_Institution
Micron Technology, Inc.
fYear
1992
fDate
2-4 June 1992
Firstpage
346
Lastpage
347
Keywords
Circuit testing; Design engineering; Design for testability; Guidelines; Lead; Printed circuits; Prototypes; Reliability engineering; Semiconductor device manufacture; Surface-mount technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Consumer Electronics, 1992. Digest of Technical Papers. ICCE., IEEE 1992 International Conference on
Conference_Location
Rosemont, IL, USA
Print_ISBN
0-7803-0479-9
Type
conf
DOI
10.1109/ICCE.1992.697255
Filename
697255
Link To Document