• DocumentCode
    2558749
  • Title

    Insulating characteristics of SF6 and SF6/N 2-mixtures for very fast transient voltages (VFT)

  • Author

    Pfeiffer, W. ; Zimmer, V. ; Zipfl, P.

  • Author_Institution
    Tech. Hochschule Darmstadt, West Germany
  • fYear
    1990
  • fDate
    3-6 Jun 1990
  • Firstpage
    240
  • Lastpage
    243
  • Abstract
    The time lags in SF6 and SF6/N2 mixtures for gaps with strong nonuniform field distribution, stressed by very fast transient voltages (VFTs), were investigated. The shape of the applied voltages was used to simulate the voltages that can occur by switch operation in gas-insulated substations (GISs). Sinusoidal voltages with different frequencies of up to 20 MHz were superimposed on a voltage step. The maximum amplitude was 160 kVpp. It is shown that the dielectric strength is not only a function of the frequency of the VFT; all the other parameters of the gap, i.e. the gap distance, the pressure of the gas, and the admixture of N2 to SF6, have to be taken into account. It was found that, under certain conditions for a 20-MHz VFT, the dielectric strength is higher than for a 8-MHz VFT. In most of the experiments, however, increasing the frequency will decrease the breakdown voltage
  • Keywords
    electric breakdown of gases; electric strength; gas mixtures; gaseous insulation; impulse testing; nitrogen; sulphur compounds; transients; 160 kV; 20 MHz; 8 MHz; SF6-N2 gas mixtures; breakdown voltage; dielectric strength; gap distance; gas-insulated substations; impulse shape; maximum amplitude; strong nonuniform field distribution; switching transients; time lags; very fast transient voltages; voltage step; waveforms; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Frequency; Geographic Information Systems; Optical distortion; Shape; Surges; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1990.109798
  • Filename
    109798