Title :
Experimental verification of sensitivity improvement in near field probes using single negative metamaterials
Author :
Boybay, Muhammed S. ; Ramahi, Omar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
In this work, we present the first experimental verification of the sensitivity improvement of evanescent field probes using single negative (SNG) metamaterials. The response of an electrically small probe to an electrically small target is investigated. The deviation in the phase of reflection coefficient due to the target is measured. When an SNG layer is employed, phase shift due to presence of a target is improved 9 times compared to a classical probe.
Keywords :
metamaterials; microwave materials; sensitivity analysis; SNG layer; electrically small probe; evanescent field probe; near field probe; reflection coefficient; sensitivity improvement; single-negative metamaterial; Composite materials; Magnetic field measurement; Magnetic materials; Metamaterials; Optical ring resonators; Probes; Reflection; Shape control; Slabs; Tellurium; Evanescent field amplification; Near field detection; Split ring resonators; subwavelength resolution;
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2009.5166037
