• DocumentCode
    2558837
  • Title

    Next generation Intel® ATOM™ processor based ultra low power SoC for handheld applications

  • Author

    Islam, Rabiul ; Sabbavarapu, Anil ; Patel, Rajesh ; Kumar, Manish ; Nguyen, Jeff ; Patel, Binta ; Kontu, Amrish

  • Author_Institution
    Intel Corp., Austin, TX, USA
  • fYear
    2010
  • fDate
    8-10 Nov. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Lincroft, the next generation Intel® ATOM™ processor based SoC specifically designed for smartphones, is fabricated in 45nm Hi-K metal gate CMOS. The design contains 140 million transistors in a die size of 65 mm2. Thermal design power (TDP) consumption is measured at 1.25W at 90°C at a frequency of 1.20GHz. Low power IO interfaces such as LPDDR1/DDR2, cDMI to IOH and cDVO for display are deployed to meet unique handheld SoC needs while consuming ultra low power. Clock architecture and clock distribution is configured with special power reduction features. As part of the extensive low power methodology, the chip is divided into numerous power domains with on die distributed powergates to reduce both active and standby power. Measured data shows up to 50X reduction in standby power. Silicon data shows dramatically low power in sleep and deeper sleep standby power states.
  • Keywords
    CMOS digital integrated circuits; elemental semiconductors; integrated circuit design; low-power electronics; microprocessor chips; mobile handsets; silicon; system-on-chip; Lincroft; Si; TDP consumption; clock architecture; clock distribution; frequency 1.20 GHz; handheld applications; low-power IO interfaces; metal gate CMOS; next generation Intel ATOM processor; power 1.25 W; silicon data; size 45 nm; sleep standby power states; smartphones; temperature 90 degC; thermal design power consumption; transistors; ultralow-power SoC; CMOS integrated circuits; Clocks; Logic gates; Power measurement; Silicon; Synchronization; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference (A-SSCC), 2010 IEEE Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8300-6
  • Type

    conf

  • DOI
    10.1109/ASSCC.2010.5716542
  • Filename
    5716542