Title :
Microdischarge Detection In High Frequency Capacitors
Author :
Nowak, C. ; Stopher, J. ; Zirnheld, J. ; Dollinger, R.
Author_Institution :
Department of Electrical and Computer Engineering University at Buffalo, SUNY
Keywords :
Aging; Breakdown voltage; Capacitors; Circuit testing; Filters; Frequency; Pulse modulation; Pulsed power supplies; Resonance; System testing;
Conference_Titel :
Power Modulator Symposium, 1994., Twenty-First International
DOI :
10.1109/MODSYM.1994.597090
