• DocumentCode
    2558904
  • Title

    TAx calibration of optical scattering parameter test set

  • Author

    Elamaran, B. ; Pollard, R.D. ; Iezekiel, S.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Leeds Univ., UK
  • fYear
    1998
  • fDate
    12-14 Oct. 1998
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    The thru-attenuator-x (TAx) family of calibration techniques has been implemented for a two-port optical test set. A wide variety of results demonstrating the good performance of these techniques applied to optical components are presented.
  • Keywords
    S-parameters; calibration; electro-optical modulation; microwave photonics; microwave reflectometry; network analysers; TAx calibration; microwave modulation response; network analyser; optical components; optical scattering parameter test set; phase performance; thru-attenuator-x; two-port optical test set; Calibration; Microwave measurements; Microwave theory and techniques; Optical devices; Optical modulation; Optical receivers; Optical scattering; Optical signal processing; Scattering parameters; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Photonics, 1998. MWP '98. International Topical Meeting on
  • Conference_Location
    Princeton, NJ, USA
  • Print_ISBN
    0-7803-4936-9
  • Type

    conf

  • DOI
    10.1109/MWP.1998.745490
  • Filename
    745490
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2558904