Title :
TAx calibration of optical scattering parameter test set
Author :
Elamaran, B. ; Pollard, R.D. ; Iezekiel, S.
Author_Institution :
Dept. of Electron. & Electr. Eng., Leeds Univ., UK
Abstract :
The thru-attenuator-x (TAx) family of calibration techniques has been implemented for a two-port optical test set. A wide variety of results demonstrating the good performance of these techniques applied to optical components are presented.
Keywords :
S-parameters; calibration; electro-optical modulation; microwave photonics; microwave reflectometry; network analysers; TAx calibration; microwave modulation response; network analyser; optical components; optical scattering parameter test set; phase performance; thru-attenuator-x; two-port optical test set; Calibration; Microwave measurements; Microwave theory and techniques; Optical devices; Optical modulation; Optical receivers; Optical scattering; Optical signal processing; Scattering parameters; Testing;
Conference_Titel :
Microwave Photonics, 1998. MWP '98. International Topical Meeting on
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-7803-4936-9
DOI :
10.1109/MWP.1998.745490
