• DocumentCode
    2559054
  • Title

    A multi-mode digital controller with windowed ADC and self-calibrated DPWM for slew-enhanced switching converter

  • Author

    Lan, Po-Hsiang ; Tseng, Chun-Yen ; Yeh, Feng-Chang ; Huang, Po-Chiun

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    8-10 Nov. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Windowed ADC is an attractive solution for the high efficiency digitally-controlled converters. However its limited conversion range restricts the transient speed for the dynamic voltage scaling applications. For slew rate improvement, this work designed a multi-mode PI/PID controller incorporated with the windowed ADC operation. In addition, to make output stable with no limit cycling, a current-controlled delay-line ADC and a DPWM with self calibration loops are proposed. The prototype chip is realized in a standard 0.18-μm CMOS process. The switching frequency of the buck converter is up to 5MHz. The average current consumed in the digital controller, ADC and DPWM are 0.25, 0.2 and 0.7mA, respectively. The transient time from 1-V to 1.7-V step is 30μs that is 2.5 times faster than the conventional linear controller design.
  • Keywords
    CMOS integrated circuits; PI control; PWM power convertors; analogue-digital conversion; calibration; digital control; switching convertors; three-term control; CMOS process; PI control; PID control; analog-digital converters; conversion range; current 0.2 mA; current 0.25 mA; current 0.7 mA; dynamic voltage scaling; frequency 5 MHz; linear controller design; multimode digital controller; self-calibrated DPWM; size 0.18 mum; slew rate improvement; slew-enhanced switching converter; time 30 mus; transient speed; transient time; voltage 1 V to 1.7 V; windowed ADC; Calibration; Converters; Delay; Oscillators; Pi control; Propagation delay; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference (A-SSCC), 2010 IEEE Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8300-6
  • Type

    conf

  • DOI
    10.1109/ASSCC.2010.5716556
  • Filename
    5716556