DocumentCode
2559066
Title
High energy gamma-ray imaging using Cherenkov cone detection - A Monte Carlo study with application to a Compton camera system
Author
Peterson, Todd E. ; Brill, A.B. ; Walenta, A.H.
Author_Institution
Dept. of Radiol. & Radiol. Sci., Vanderbilt Univ., Nashville, TN, USA
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
3246
Lastpage
3253
Abstract
With the availability of single-photon detecting Si-APD´s and multi-anode PM tubes, the technical basis for the detection of Cherenkov light produced by Compton electrons in a dense absorbing detector from 1 to 10 MeV gamma rays is given. In a Monte Carlo simulation study using detailed electron track and Cherenkov light simulation, we show that in many transparent materials enough visible light photons are created (up to 400) to support detection of high energy gamma rays. Since the opening angle of the light cone is practically saturated, the reconstruction of the 3D position of interaction should be possible. At the same time we found that the angular spread is dominated by multiple scattering, compromising this option. However, a more detailed study of materials shows that optimization may make possible good position resolution and depth measurement for parallax correction.
Keywords
Cherenkov counters; Compton effect; Monte Carlo methods; avalanche photodiodes; cameras; gamma-ray detection; light cones; particle tracks; photodetectors; photomultipliers; position sensitive particle detectors; scintillation counters; silicon radiation detectors; 3D position reconstruction; APD; Cherenkov light cone detection; Cherenkov light simulation; Compton camera system; Compton electron; Monte Carlo method; dense absorbing detector; depth measurement; electron track; electron volt energy 1 MeV to 10 MeV; gamma-ray imaging; light cone; multianode PM tube; optimization; parallax correction; photodetector; position resolution; scattering; transparent material; visible light photon;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551741
Filename
6551741
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