DocumentCode :
2559188
Title :
A 30Gb/s/link 2.2Tb/s/mm2 inductively-coupled injection-locking CDR
Author :
Take, Yasuhiro ; Miura, Noriyuki ; Kuroda, Tadahiro
Author_Institution :
Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
fYear :
2010
fDate :
8-10 Nov. 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents a 30 Gb/s/link 2.2 Tb/s/mm2 inductive-coupling link for a high-speed DRAM interface. The data rate per layout area is the highest among DRAM interfaces reported up to now. The proposed interface employs a high-speed injection-locking CDR technique that utilizes the derivative property of inductive coupling. Compared to conventional injection-locking CDR based on an XOR edge detector, our technique doubles the operation speed and increases the data rate to 30 Gb/s/link. As a result, the data rate per layout area is increased to 2.2 Tb/s/mm2, which is 2X that of the state-of-the-art inductive-coupling link, and 22X that of the state-of-the-art wired link.
Keywords :
DRAM chips; clock and data recovery circuits; XOR edge detector; clock; data recovery; high-speed DRAM interface; inductive-coupling link; inductively-coupled CDR; injection-locking CDR; Layout; Phase locked loops; Random access memory; Receivers; Synchronization; Transmitters; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2010 IEEE Asian
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8300-6
Type :
conf
DOI :
10.1109/ASSCC.2010.5716562
Filename :
5716562
Link To Document :
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