• DocumentCode
    2559314
  • Title

    Subpicosecond laser breakdown in optical thin films

  • Author

    Emmert, L.A. ; Nguyen, D.N. ; Rudolph, W.

  • Author_Institution
    Dept. of Phys., Univ. of New Mexico, Albuquerque, NM, USA
  • fYear
    2011
  • fDate
    26-30 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Experimental and theoretical progress on subpicosecond laser pulse breakdown in dielectric films is reviewed. The single pulse threshold fluences can be related to fundamental material properties and scaling laws with respect to pulse duration and material bandgap are discussed. Multiple pulse thresholds are controlled by native and laser-induced defects. A phenomenological model is introduced that describes the accumulation and relaxation of such defects. The model is able to explain the experiments and can be used to assess relevant defect parameters. Experimental results are presented that exemplify how the ambient atmosphere affects the multiple pulse laser damage thresholds.
  • Keywords
    dielectric thin films; energy gap; laser beam effects; laser materials processing; optical films; defect parameters; dielectric films; laser-induced defects; material bandgap; multiple pulse laser damage thresholds; optical thin films; phenomenological model; pulse duration; scaling laws; subpicosecond laser pulse breakdown; Electric breakdown; Films; Laser excitation; Laser modes; Measurement by laser beam; Photonic band gap; dielectric thin films; femtosecond laser pulses; optical coatings;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transparent Optical Networks (ICTON), 2011 13th International Conference on
  • Conference_Location
    Stockholm
  • ISSN
    2161-2056
  • Print_ISBN
    978-1-4577-0881-7
  • Electronic_ISBN
    2161-2056
  • Type

    conf

  • DOI
    10.1109/ICTON.2011.5970921
  • Filename
    5970921