Title :
A 31mA CMOS wideband BD-II B2&B3 mode receiver with 55dB gain dynamic range
Author :
Wang, Chuan ; Shi, Congyin ; Le Ye ; Hou, Zhongyuan ; Liao, Huailin ; Huang, Ru
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
Abstract :
A CMOS wideband receiver for BD-II B2&B3 mode is presented. The chip demonstrates a noise figure of 4.0dB and a 2dB CNR desensitization point of 4dBm at 800MHz GSM blocker. Due to the optimized design of an ESD-protected LNA and a 1/f-noise-reduced high-LO-RF-isolation Mixer, the spurious level is suppressed below -113dBm referred to the RF input. The fractional-N ΣΔ synthesizer obtains LO phase noise of -92dBc/Hz@1KHz and -117dBc/Hz@1MHz, with the reference spurs are below -60dBc. The integrated 4th-order LPF has tunable 7.5MHz/10MHz/15MHz corner frequency. The mixed-signal AGC loop, including 4-bit ADCs, variable gain amplifier and programmable amplifier, achieves 55dB gain dynamic range. The receiver consumes 31mA from a 1.8-V supply voltage while occupying a 5.5-mm2 die area including ESD pads.
Keywords :
1/f noise; CMOS integrated circuits; UHF amplifiers; cellular radio; electrostatic discharge; low noise amplifiers; phase noise; radio receivers; sigma-delta modulation; 1/f noise; ADC; BD-II B2&B3 mode receiver; CMOS wideband receiver; ESD-protected LNA; GSM blocker; current 31 mA; fractional-N ΣΔ synthesizer; frequency 800 MHz; gain 55 dB; isolation mixer; mixed-signal AGC loop; noise figure 4.0 dB; phase noise; programmable amplifier; variable gain amplifier; voltage 1.8 V; Frequency measurement; Mixers; Noise measurement; Phase noise; Radio frequency; Receivers;
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2010 IEEE Asian
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8300-6
DOI :
10.1109/ASSCC.2010.5716574