Title :
Coupled disk microresonators
Author :
Schmidt, C. ; Liebsch, M. ; Chipouline, A. ; Janunts, N. ; Käsebier, T. ; Kley, E.-B. ; Tunermann, A. ; Pertsch, T.
Author_Institution :
Inst. of Appl. Phys., Friedrich-Schiller-Univ. Jena, Jena, Germany
Abstract :
The eigenstates of fused silica coupled disk microresonators of different configuration are investigated. The optical field distributions of the coupled disks are measured using a special scattering SNOM technique correlating the position of the tip with reflection from the excited mode. A detailed spatial and spectral analysis provides picture of evolution of the mode distribution in coupled disk microresonators when scanning through the split resonances of the coupled disk system. Applying optical pump powers in the very low milliwatt range, strong temperature induced nonlinear resonance shift of the coupled disk eigenstates is observed, leading to optical bistability. The observed effects are in agreement with simulations using a theoretical model within the scope of nonlinear coupled mode theory.
Keywords :
coupled mode analysis; light reflection; light scattering; micro-optomechanical devices; micromechanical resonators; near-field scanning optical microscopy; optical bistability; optical pumping; optical variables measurement; silicon compounds; spectral analysis; SiO2; coupled disk eigenstates; coupled disk microresonators; excited mode; fused silica; light reflection; mode distribution; nonlinear coupled mode theory; nonlinear resonance shift; optical bistability; optical field distributions; optical pump powers; spatial analysis; special scattering SNOM technique; spectral analysis; split resonances; Integrated optics; Microcavities; Nonlinear optics; Optical bistability; Optical pumping; Reflection; coupled microresonators; microdisks; optical bistability; scanning near-field optical microscopy; thermal nonlinearity;
Conference_Titel :
Transparent Optical Networks (ICTON), 2011 13th International Conference on
Conference_Location :
Stockholm
Print_ISBN :
978-1-4577-0881-7
Electronic_ISBN :
2161-2056
DOI :
10.1109/ICTON.2011.5970931