DocumentCode :
2559604
Title :
Second-order effects in self-testable accelerometers
Author :
de Bruin, D.W. ; Allen, H.V. ; Terry, S.C.
Author_Institution :
IC Sensors, Milpitas, CA, USA
fYear :
1990
fDate :
4-7 June 1990
Firstpage :
149
Lastpage :
152
Abstract :
The self-testable accelerometer, which is a modification of a piezoresistive, doubly supported cantilever structure, is discussed along with second-order effects. In order to incorporate the self-test function, the overforce stops which limit travel have been enlarged to form electrodes. The cross-section of the device is shown. A metal plate is deposited on the seismic mass and connected across the flexures to an outside bond pad. The top and bottom caps that provide protection against overforce and contamination are processed in such a manner that they are electrically connected to the substrate, thereby surrounding the self-test electrode in an electrically neutral environment.<>
Keywords :
accelerometers; piezoelectric transducers; contamination; doubly supported cantilever structure; electrically neutral environment; overforce stops; piezoresistive devices; second-order effects; seismic mass; self-testable accelerometers; Accelerometers; Built-in self-test; Dielectrics; Electrodes; Electrostatic measurements; Force feedback; Force sensors; Pulse measurements; Springs; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensor and Actuator Workshop, 1990. 4th Technical Digest., IEEE
Conference_Location :
Hilton Head Island, SC, USA
Type :
conf
DOI :
10.1109/SOLSEN.1990.109841
Filename :
109841
Link To Document :
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