A sea-of-gates-based, 10 MIPS 16-bit RISC processor testbed for failsafe applications

Author

Jurczyk, Michael ; Schwederski, Thomas

Author_Institution

Inst. for Microelectron. Stuttgart, Germany

fYear

1993

fDate

22-25 Feb 1993

Firstpage

536

Lastpage

540

Abstract

A sea-of-gates-based, 16-bit RISC processor testbed with a maximum performance of 10 MIPS at a 20 MHz clock rate is described. Starting from a small core requiring only 3000 gates, features can be added in a flexible manner to obtain various system architectures suited for failsafe applications. The core has a load-store Harvard architecture with 24-bit instructions, a 16-bit data path, and a two-stage pipeline. The data path contains sixteen 16-bit general purpose registers and a high-speed 16-bit carry-select adder. The core version has been fabricated on a 1.2 mm GATE FOREST master. An experimental version with control flow checking, boundary scan capability with integrated pad-test and 100% stuck-fault coverage is in fabrication. Software support includes high-level and RT-level simulators, assembler and PASCAL-compiler

Keywords

application specific integrated circuits; automatic test software; boundary scan testing; built-in self test; computer testing; integrated circuit testing; logic arrays; logic testing; reduced instruction set computing; 10 MIPS; 16 bit; 20 MHz; GATE FOREST master; PASCAL-compiler; RISC processor testbed; RT-level simulators; assembler; boundary scan capability; carry-select adder; control flow checking; failsafe applications; general purpose registers; high-level simulator; integrated pad-test; load-store Harvard architecture; microprocessor core; sea-of-gates-based; semicustom; two-stage pipeline; Automatic testing; Central Processing Unit; Circuit faults; Circuit testing; Hardware; Integrated circuit testing; Microprocessors; Reduced instruction set computing; Switches; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on

Conference_Location

Paris

Print_ISBN

0-8186-3410-3

Type

conf

DOI

10.1109/EDAC.1993.386420

Filename

386420