Title :
High-stress and overrange behavior of sealed-cavity polysilicon pressure sensors
Author :
Chau, K.H. ; Fung, C.D. ; Harris, P.R. ; Panagou, J.G.
Author_Institution :
Foxboro Co., MA, USA
Abstract :
The overrange behavior of sealed-cavity polysilicon pressure sensors with full-scale pressures ranging from 35 to 300 psi (0.24 to 2.0 MPa) is investigated. Because of a built-in overpressure stop, rupture pressure between 3500 to 6000 psi (24 to 41 MPa) was observed. After repetitive cycles of overpressure to 3000 psi, no degradation in sensor performance was apparent, and the zero repeatability was better than 0.1% of span. These results demonstrate the outstanding overrange capabilities of sealed-cavity polysilicon sensors and the exceptional mechanical strength and reproducibility of polysilicon diaphragms for pressure sensing. The excellent built-in overrange protection represents a significant advantage of the sealed-cavity polysilicon sensors for industrial applications where high overrange pressure is common.<>
Keywords :
electric sensing devices; elemental semiconductors; pressure transducers; silicon; full-scale pressures; industrial applications; mechanical strength; overrange behavior; polysilicon diaphragms; pressure sensors; rupture pressure; sealed-cavity polysilicon sensors; sensor performance; zero repeatability; Etching; Fabrication; Mechanical sensors; Piezoresistance; Reproducibility of results; Resistors; Silicon; Substrates; Temperature sensors; Testing;
Conference_Titel :
Solid-State Sensor and Actuator Workshop, 1990. 4th Technical Digest., IEEE
Conference_Location :
Hilton Head Island, SC, USA
DOI :
10.1109/SOLSEN.1990.109849