DocumentCode :
2559762
Title :
An effective recipe control and management system (RCMS) deployed in semiconductor manufacturing
Author :
Tseng, Shou-Chi ; Chen, Shu-Li ; Chang, Jen-Kuan ; Chen, Chien-Chang ; Chen, Mei-Ling
Author_Institution :
United Microelectron. Corp., Hsinchu, Taiwan
fYear :
2004
fDate :
9-10 Sept. 2004
Firstpage :
135
Lastpage :
138
Abstract :
As semiconductor manufacturing technology is becoming increasingly complex, hundreds of tools and process steps need to be strictly controlled and managed in the production line. The review of past wafer scrap history has revealed that one major scrap category was caused by inadvertent human error inducing un-intended change of the recipe setting in production tools. In order to get better production line yield and to assure wafer manufacturing quality, it is mandatory to prevent such human errors. Consequently, an effective recipe control and management methodology through a preventive system approach is required. At UMC, we have developed a recipe control and management system (RCMS) for this purpose. This work presents an overview of this RCMS system and management approaches. The latter includes supporting systems such as a recipe change co-sign system, job-in-cancel function, alarm disposition request (ADR), advanced pre-checking scheme on newly releasing a product for mass production, and post auditing reports on RCMS execution performance review. The RCMS and supporting systems together have provided a comprehensive & effective measure on recipe control and management in a preventive and foolproof manner.
Keywords :
integrated circuit manufacture; manufacturing processes; process control; production engineering computing; production equipment; semiconductor device manufacture; semiconductor technology; advanced pre-checking scheme; alarm disposition request; job-in-cancel function; management system; mass production; post auditing report; recipe change co-sign system; recipe control; semiconductor manufacturing technology; wafer scrap; Automatic control; Control systems; Databases; Degradation; Humans; Maintenance engineering; Manufacturing automation; Manufacturing processes; Production; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Technology Workshop Proceedings, 2004
Print_ISBN :
0-7803-8469-5
Type :
conf
DOI :
10.1109/SMTW.2004.1393748
Filename :
1393748
Link To Document :
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