DocumentCode :
2559960
Title :
Heat transfer and nonlinear thermal stress analysis of a convective surface mount package
Author :
Hong, BorZen ; Yuan, Tsorng-Dih
Author_Institution :
Microelectron. Div., IBM Corp., Hopewell Junction, NY, USA
fYear :
1996
fDate :
29 May-1 Jun 1996
Firstpage :
100
Lastpage :
107
Abstract :
Most prior heat transfer and thermal stress analyses of convective surface mount packages have relied on either an isothermal (constant temperature) model or a constant heat transfer coefficient thermal model. This usually leads to a concern for the accurate estimation of the local temperature distributions and the induced stresses. To release this concern, this paper presents the use of the finite element method in conjunction with a local heat transfer coefficient model in predicting the local temperature and stress distributions of a ceramic ball grid array (CBGA) package. A thermal boundary condition of the local heat transfer coefficient model was obtained from a previous computational fluid dynamics (CFD) solution. The analysis results are compared with that predicted by the isothermal model and the constant heat transfer coefficient model. Instances where the temperature dependent and elastic-plastic behavior are significant in some components of the modeled package are also examined
Keywords :
convection; finite element analysis; heat transfer; integrated circuit packaging; surface mount technology; temperature distribution; thermal analysis; thermal stresses; CBGA package; ceramic BGA package; ceramic ball grid array; computational fluid dynamics solution; convective surface mount package; elastic-plastic behavior; finite element method; heat transfer; induced stresses; local heat transfer coefficient model; local temperature distributions; nonlinear thermal stress analysis; stress distributions; thermal boundary condition; Boundary conditions; Ceramics; Computational fluid dynamics; Electronics packaging; Finite element methods; Heat transfer; Isothermal processes; Predictive models; Temperature distribution; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1996. I-THERM V., Inter-Society Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3325-X
Type :
conf
DOI :
10.1109/ITHERM.1996.534550
Filename :
534550
Link To Document :
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