DocumentCode :
256001
Title :
An experimental analysis on how the dead-time of SiC BJT and SiC MOSFET impacts the losses in a high-frequency resonant converter
Author :
Tolstoy, Georg ; Ranstad, Per ; Colmenares, Juan ; Peftitsis, Dimosthenis ; Giezendanner, Florian ; Rabkowski, Jacek ; Nee, H.-P.
Author_Institution :
Electr. Energy Conversion, KTH R. Inst. of Technol., Stockholm, Sweden
fYear :
2014
fDate :
26-28 Aug. 2014
Firstpage :
1
Lastpage :
10
Abstract :
Active control of the dead-time in a SLR converter is in this paper shown to be of great importance. The efficiency of the full-bridge will increase if the dead-time control is made in the right way. Different control algorithms are shown to work well for different power switches. For the SiC MOSFET and the SiC BJT the control algorithms are tested experimentally.
Keywords :
MOSFET; bipolar transistors; delays; losses; resonant power convertors; silicon compounds; SLR converter; SiC; SiC BJT; SiC MOSFET; bipolar junction transistor; dead-time active control algorithm; experimental analysis; full-bridge efficiency; high-frequency resonant converter; loss; metal-oxide-semiconductor field-effect transistor; power switch; series-loaded resonant converter; Capacitance; Frequency modulation; Insulated gate bipolar transistors; MOSFET; Silicon; Silicon carbide; Snubbers; Converter control; High frequency power converter; Resonant converter; Silicon Carbide (SiC); Soft switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications (EPE'14-ECCE Europe), 2014 16th European Conference on
Conference_Location :
Lappeenranta
Type :
conf
DOI :
10.1109/EPE.2014.6911042
Filename :
6911042
Link To Document :
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