DocumentCode :
2560039
Title :
Developing statistical models in an early warning system and its empirical study
Author :
Chen, Pei-Nong ; Chien, Chen-Fu ; Wang, Sheng-Jen ; Chen, Chien-Chung ; Luo, Haw-Jyue
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2004
fDate :
9-10 Sept. 2004
Firstpage :
174
Lastpage :
177
Abstract :
When a new equipment or process is released, it is critical to ensure it behave as expected and stay in normal condition. The study proposes a research framework in which a statistical model is constructed for newly released equipment and process monitoring. An empirical study is conducted in a DRAM fabrication facility for validation. Based on the model, a best set of sample test items which discriminates the newly released equipment is selected and a group of normal equipments is obtained. Thus, the alarm signals can be triggered in an early warning system.
Keywords :
DRAM chips; alarm systems; integrated circuit manufacture; preventive maintenance; process monitoring; production equipment; statistical analysis; DRAM fabrication facility; developing statistical model; early warning system; process monitoring; semiconductor manufacturing; Alarm systems; Data engineering; Data mining; Fabrication; Manufacturing processes; Monitoring; Power system modeling; Random access memory; Signal processing; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Technology Workshop Proceedings, 2004
Print_ISBN :
0-7803-8469-5
Type :
conf
DOI :
10.1109/SMTW.2004.1393758
Filename :
1393758
Link To Document :
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