DocumentCode :
2560136
Title :
Multi-level logic optimization by redundancy addition and removal
Author :
Cheng, Kwang-Ting ; Entrena, Luis A.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1993
fDate :
22-25 Feb 1993
Firstpage :
373
Lastpage :
377
Abstract :
A multilevel logic optimization technique is presented that is a generalization of redundancy removal and Boolean resubstitution. The network is optimized through iterative addition and deletion of redundant connections. With the use of the connection fault model, the problem of identifying connections that can be made without affecting the network´s functionality is converted into the problem of identifying redundant connection faults. Efficient test generation algorithms can thus be applied directly. Techniques that can efficiently locate redundant wires and/or nodes after adding a redundant wire are also proposed. Experiment results on MCNC benchmark circuits show that, on average, a 16% reduction in gate count and a 20% reduction in connection count can be achieved at a low computational cost. The suggested technique can also be applied for timing optimization
Keywords :
Boolean functions; circuit optimisation; combinational circuits; logic CAD; multivalued logic circuits; redundancy; Boolean resubstitution; MCNC benchmark circuits; connection count; connection fault model; deletion; gate count; iterative addition; low computational cost; multilevel logic optimization; redundancy addition; redundancy removal; redundant connections; test generation algorithms; timing optimization; Benchmark testing; Boolean functions; Circuit faults; Circuit testing; Computational efficiency; Fault diagnosis; Iterative algorithms; Logic; Redundancy; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location :
Paris
Print_ISBN :
0-8186-3410-3
Type :
conf
DOI :
10.1109/EDAC.1993.386447
Filename :
386447
Link To Document :
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