• DocumentCode
    2560172
  • Title

    Application of connectionist learning methods to manufacturing process monitoring

  • Author

    Franklin, Judy A. ; Sutton, Richard S. ; Anderson, Charles W.

  • Author_Institution
    GTE Lab. Inc., Waltham, MA, USA
  • fYear
    1988
  • fDate
    24-26 Aug 1988
  • Firstpage
    709
  • Lastpage
    712
  • Abstract
    It is demonstrated that connectionist learning networks can monitor manufacturing processes to determine causal relationships with an accuracy competitive with that of conventional statistical techniques. Moreover, the network operates online, in realtime, and with substantial savings in computational complexity as compared with conventional CIM techniques. Two approaches are compared. One employs standard procedures to find correlations between sensor measurements and quality. The sensor data from the production line are collected over a period of time, and correlations are made offline at infrequent intervals using analyses such as linear regression. The second approach is to estimate the correlations incrementally, as the data are collected, online and in real-time. The estimates are updated incrementally using connectionist learning procedures. Simulation results are presented for a fluorescent bulb manufacturing line
  • Keywords
    computational complexity; computerised monitoring; fluorescent lamps; learning systems; manufacturing computer control; neural nets; quality control; CIM; causal relationships; computational complexity; connectionist learning methods; correlations; fluorescent bulb manufacturing line; linear regression; manufacturing process monitoring; online operation; quality; sensor measurements; statistical techniques; Computational complexity; Computer integrated manufacturing; Fluorescence; Learning systems; Linear regression; Manufacturing processes; Measurement standards; Monitoring; Production; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control, 1988. Proceedings., IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    2158-9860
  • Print_ISBN
    0-8186-2012-9
  • Type

    conf

  • DOI
    10.1109/ISIC.1988.65518
  • Filename
    65518