Title :
Diamond-based microdischarges: Studying the role of wall materials with electrical and optical diagnostics
Author :
Mitea, S. ; Bowden, M.D. ; Braithwaite, N. St J ; Zeleznik, M. ; May, P.W. ; Fox, N.A. ; Fowler, C. ; Stevens, R.
Author_Institution :
Dept. of Phys. Sci., Open Univ., Milton Keynes, UK
Abstract :
Microplasma studies have confirmed the influence of the electrode and dielectric materials on ignition and stability1,2,3. The chemical, thermal and electrical properties of the dielectric are particularly critical. For the electrodes, metal and semiconductors result in different microplasma characteristics4. The aim of our research is to characterise the effects of surface materials on microdischarge behaviour. Diamond or silicon dioxide were used as the dielectric. Electrodes consisted of semiconducting diamond, silicon or metal. Diamond was obtained by chemical vapour deposition. The electrodes were fabricated by p-type doping of the thin films. This offered us a range of materials properties to characterise the microplasma against. In addition we studied the influence of dimensions (diameters between 25 and 200μm) for both single devices and arrays. We present optical studies of microplasma in noble gas. In particular we report on gas temperature measurements obtained with emission spectroscopy. Finally we correlate these results, along with electrical characteristics, with the different materials and dimensions mentioned above.
Keywords :
chemical vapour deposition; diamond; discharges (electric); electrodes; elemental semiconductors; ignition; luminescence; plasma diagnostics; plasma-wall interactions; semiconductor doping; semiconductor growth; semiconductor thin films; silicon; silicon compounds; wide band gap semiconductors; C; Si; SiO2; chemical properties; chemical vapour deposition; diamond-based microdischarges; dielectric material; electrical characteristics; electrical diagnostics; electrical properties; electrode material; emission spectroscopy; gas temperature measurements; ignition; material properties; microdischarge behaviour; microplasma characteristics; optical diagnostics; p-type doping; semiconducting diamond; semiconductors; single devices; size 25 mum to 200 mum; surface material effects; thermal properties; thin films; wall materials; Educational institutions; Electrodes; Optical device fabrication; Optical films; Physics;
Conference_Titel :
Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4577-2127-4
Electronic_ISBN :
0730-9244
DOI :
10.1109/PLASMA.2012.6383666