DocumentCode :
2560555
Title :
Impact of analog IC impairments in SiPM interface electronics
Author :
Dey, Shuvashis ; Lewellen, Thomas K. ; Miyaoka, Robert S. ; Rudell, J.C.
Author_Institution :
Electr. Eng. Dept., Univ. of Washington, Seattle, WA, USA
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
3572
Lastpage :
3574
Abstract :
The recent realization of Silicon Photomultiplier (SiPM) devices as solid-state detectors for Positron Emission Tomography holds the promise of improving image resolution, integrating a significant portion of the interface electronics, and potentially lowering the power consumption. Our lab has previously reported on novel board-level readout electronics for an 8×8 silicon photomultiplier (SiPM) array featuring row/column summation technique to reduce the hardware requirements for signal processing and is currently working on taking the next step by implementing a monolithic CMOS chip which is based on the row-column architecture. To date, relatively little modeling has been done to understand the impact of analog non-idealities associated with the front-end electronics, on SiPM-based PET systems. This paper focuses on various analog impairments associated with PET scanner readout electronics. Matlab was used as a simulation platform to model the noise, linearity and signal bandwidth of the frontend electronics with the measured SiPM pulses as the input.
Keywords :
CMOS integrated circuits; analogue integrated circuits; elemental semiconductors; integrated optoelectronics; optical arrays; optical scanners; photodetectors; photomultipliers; positron emission tomography; readout electronics; silicon; PET scanner readout electronics; Si; SiPM array; SiPM interface electronics; analog IC impairments; analog nonidealities impact; board-level readout electronics; frontend electronics; image resolution; measured SiPM pulses; monolithic CMOS chip; noise modelling; positron emission tomography; power consumption; row-column architecture; row-column summation technique; signal bandwidth; signal processing; silicon photomultiplier devices; simulation platform; solid-state detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551818
Filename :
6551818
Link To Document :
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