• DocumentCode
    2560555
  • Title

    Impact of analog IC impairments in SiPM interface electronics

  • Author

    Dey, Shuvashis ; Lewellen, Thomas K. ; Miyaoka, Robert S. ; Rudell, J.C.

  • Author_Institution
    Electr. Eng. Dept., Univ. of Washington, Seattle, WA, USA
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    3572
  • Lastpage
    3574
  • Abstract
    The recent realization of Silicon Photomultiplier (SiPM) devices as solid-state detectors for Positron Emission Tomography holds the promise of improving image resolution, integrating a significant portion of the interface electronics, and potentially lowering the power consumption. Our lab has previously reported on novel board-level readout electronics for an 8×8 silicon photomultiplier (SiPM) array featuring row/column summation technique to reduce the hardware requirements for signal processing and is currently working on taking the next step by implementing a monolithic CMOS chip which is based on the row-column architecture. To date, relatively little modeling has been done to understand the impact of analog non-idealities associated with the front-end electronics, on SiPM-based PET systems. This paper focuses on various analog impairments associated with PET scanner readout electronics. Matlab was used as a simulation platform to model the noise, linearity and signal bandwidth of the frontend electronics with the measured SiPM pulses as the input.
  • Keywords
    CMOS integrated circuits; analogue integrated circuits; elemental semiconductors; integrated optoelectronics; optical arrays; optical scanners; photodetectors; photomultipliers; positron emission tomography; readout electronics; silicon; PET scanner readout electronics; Si; SiPM array; SiPM interface electronics; analog IC impairments; analog nonidealities impact; board-level readout electronics; frontend electronics; image resolution; measured SiPM pulses; monolithic CMOS chip; noise modelling; positron emission tomography; power consumption; row-column architecture; row-column summation technique; signal bandwidth; signal processing; silicon photomultiplier devices; simulation platform; solid-state detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551818
  • Filename
    6551818