DocumentCode
2560650
Title
On the design and analysis of unmatched LFSR pattern generators in pseudorandom testing
Author
Li, Weitlong ; McCrosky, Carl ; Abd-El-Barr, Mostafa
Author_Institution
Dept. of Comput. Sci., Univ. of Saskatchewan, Saskatoon, Sask., Canada
fYear
1993
fDate
22-25 Feb 1993
Firstpage
217
Lastpage
222
Abstract
An area efficient design of unmatched pattern generators with dynamic connections for circuits with many inputs is presented. For a circuit with n inputs, instead of requiring n flip-flops, the design needs only m + [n /m ] flip-flops and a connection mapping network. m flip-flops are used to construct a primary LFSR (linear feedback shift register) for pattern generation. The other [n /m ] flip-flops form a secondary LFSR that dynamically changes the connections between the primary LFSR outputs and circuit inputs by controlling the mapping network. Experiments show that the proposed design is less costly in area as compared to matched designs and also achieves better test quality than either the matched or unmatched designs with static connections
Keywords
built-in self test; flip-flops; integrated circuit testing; logic testing; shift registers; BIST; area efficient design; circuits with many inputs; connection mapping network; dynamic connections; flip-flops; pseudorandom testing; unmatched LFSR pattern generators; Circuit faults; Circuit testing; Complexity theory; Feedback circuits; Hardware; Pattern analysis; Pattern matching; Random sequences; Software testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location
Paris
Print_ISBN
0-8186-3410-3
Type
conf
DOI
10.1109/EDAC.1993.386473
Filename
386473
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