• DocumentCode
    2560650
  • Title

    On the design and analysis of unmatched LFSR pattern generators in pseudorandom testing

  • Author

    Li, Weitlong ; McCrosky, Carl ; Abd-El-Barr, Mostafa

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Saskatchewan, Saskatoon, Sask., Canada
  • fYear
    1993
  • fDate
    22-25 Feb 1993
  • Firstpage
    217
  • Lastpage
    222
  • Abstract
    An area efficient design of unmatched pattern generators with dynamic connections for circuits with many inputs is presented. For a circuit with n inputs, instead of requiring n flip-flops, the design needs only m + [n/m] flip-flops and a connection mapping network. m flip-flops are used to construct a primary LFSR (linear feedback shift register) for pattern generation. The other [n/m] flip-flops form a secondary LFSR that dynamically changes the connections between the primary LFSR outputs and circuit inputs by controlling the mapping network. Experiments show that the proposed design is less costly in area as compared to matched designs and also achieves better test quality than either the matched or unmatched designs with static connections
  • Keywords
    built-in self test; flip-flops; integrated circuit testing; logic testing; shift registers; BIST; area efficient design; circuits with many inputs; connection mapping network; dynamic connections; flip-flops; pseudorandom testing; unmatched LFSR pattern generators; Circuit faults; Circuit testing; Complexity theory; Feedback circuits; Hardware; Pattern analysis; Pattern matching; Random sequences; Software testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-3410-3
  • Type

    conf

  • DOI
    10.1109/EDAC.1993.386473
  • Filename
    386473