Title :
LFSROM: Basic Principle and BIST application
Author :
Dufaza, C. ; Chevalier, C.
Author_Institution :
UMR-CNRS, Univ. Montpellier II, France
Abstract :
A built-in self test (BIST) approach wherein the on-chip test pattern generator is basically the combination of a LFSR, on OR2 network and a set of multiplexers is described. Given precomputed sequences of deterministic test vectors, it is illustrated by some examples that this LFSROM generator provides data storage performances comparable in quality to a ROM
Keywords :
automatic testing; built-in self test; integrated circuit testing; logic testing; read-only storage; shift registers; BIST application; LFSR; LFSROM; OR2 network; data storage performances; deterministic test vectors; on-chip test pattern generator; precomputed sequences; set of multiplexers; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Network-on-a-chip; Pattern analysis; Read only memory; Robots; Test pattern generators;
Conference_Titel :
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location :
Paris
Print_ISBN :
0-8186-3410-3
DOI :
10.1109/EDAC.1993.386474
