Title : 
Delta-Sigma Based CMOS Stress Sensor with RF Output
         
        
            Author : 
Chen, Yonggang ; Jaeger, Richard C. ; Suhling, Jeffrey C.
         
        
            Author_Institution : 
Alabama Microelectron. Sci. & Technol. Center, Auburn
         
        
        
        
        
        
            Abstract : 
A CMOS stress sensor is merged with a delta-sigma modulator to produce a sensor with a low frequency RF output. A PMOS current mirror with two orthogonal transistors is used as the stress sensor. The delta-sigma modulator generates an output signal that can be processed digitally or monitored by a communications receiver. The frequency shift of the DSBSC output of the modulator is directly proportional to the stress induced mismatch in the sensor cell. A test chip demonstrating the sensor has been fabricated using the 1.5 mum MOSIS CMOS process.
         
        
            Keywords : 
CMOS integrated circuits; delta-sigma modulation; radiofrequency integrated circuits; sensors; DSBSC; MOSIS CMOS process; PMOS current mirror; RF Output; communications receiver; delta-sigma based CMOS stress sensor; delta-sigma modulator; orthogonal transistors; size 1.5 mum; CMOS process; Delta modulation; Digital modulation; Mirrors; Monitoring; Radio frequency; Signal generators; Signal processing; Stress; Testing;
         
        
        
        
            Conference_Titel : 
Solid-State Circuits Conference, 2006. ASSCC 2006. IEEE Asian
         
        
            Conference_Location : 
Hangzhou
         
        
            Print_ISBN : 
0-7803-9734-7
         
        
            Electronic_ISBN : 
0-7803-97375-5
         
        
        
            DOI : 
10.1109/ASSCC.2006.357896