• DocumentCode
    2560825
  • Title

    A modular approach for analyzing static and dynamic fault trees

  • Author

    Gulati, Rohit ; Dugan, Joanne Bechta

  • Author_Institution
    Alta Group of Cadence Design Syst., Sunnyvale, CA, USA
  • fYear
    1997
  • fDate
    13-16 Jan 1997
  • Firstpage
    57
  • Lastpage
    63
  • Abstract
    Three commonly used analytical techniques for reliability evaluation are fault trees, binary decision diagrams (BDD) and Markov chains. Each of these techniques have advantages and disadvantages and the choice depends on the system being modeled. Fault trees have been found to be the most popular choice in terms of building an analytical model of a system. It provides a compact representation of the system and is easily understood by humans. However, fault trees lack the modeling power and solution time increases exponentially with the size of the system being modeled. In this paper, we present a new exciting hybrid approach, called the modular approach, for the efficient analysis of both static and dynamic fault trees. It provides a combination of BDD solution for static fault trees and Markov chain solution for dynamic fault trees coupled with the detection of independent subtrees. The algorithms used for modularization, integrating the results obtained from the separate solution of the independent modules (subtrees) and incorporating coverage modeling are discussed in detail in this paper. The modular approach is applied to an example system to demonstrate the potential of this research
  • Keywords
    Markov processes; decision theory; fault trees; reliability; Markov chain solution; binary decision diagrams; coverage modeling; dynamic fault trees; hybrid approach; independent subtrees detection; modular approach; reliability evaluation; static fault trees; system analytical model; Analytical models; Binary decision diagrams; Boolean functions; Data structures; Fault detection; Fault trees; Humans; Missiles; Power system modeling; Space stations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium. 1997 Proceedings, Annual
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-3783-2
  • Type

    conf

  • DOI
    10.1109/RAMS.1997.571665
  • Filename
    571665