• DocumentCode
    2560915
  • Title

    Automatic generation algorithms, experiments and comparisons of self-checking PLA schemes using parity codes

  • Author

    Boudjit, M. ; Nicolaidis, M. ; Torki, K.

  • Author_Institution
    Reliable Integrated Syst. Group, IMAG/TIMA, Grenoble, France
  • fYear
    1993
  • fDate
    22-25 Feb 1993
  • Firstpage
    144
  • Lastpage
    150
  • Abstract
    Self-checking circuits ensure concurrent error detection by means of hardware redundancy. An important drawback of self-checking circuits is that they involve a significant increasing of the circuit area. Recent experiments on Berger-code encoded PLAs result on 46.9% average area overhead. In order to decrease this overhead, the authors present a tool that generates self-checking PLAs using parity encoding for the product terms and the outputs. This tool has been used for experimenting on several benchmark PLAs. In these experiments the authors retain for each PLA case the scheme involving the lower area overhead. Thus the mean overhead is reduced from 46.9% [TCR 91] to 37.2% (24.9% if a PLA named misex3 is not included)
  • Keywords
    codes; design for testability; logic CAD; logic testing; programmable logic arrays; automatic generation algorithms; concurrent error detection; design for testability; hardware redundancy; mean overhead; parity codes; parity encoding; programmable logic array; self-checking circuits; Channel hot electron injection; Circuit faults; Circuit testing; Electrical fault detection; Encoding; Fault detection; Hardware; Integrated circuit reliability; Minimization; Programmable logic arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-3410-3
  • Type

    conf

  • DOI
    10.1109/EDAC.1993.386485
  • Filename
    386485