• DocumentCode
    2560930
  • Title

    A 0.18=μm Probabilistic-Based Noise-Tolerate Circuit Design and Implementation with 28.7dB Noise-Immunity Improvement

  • Author

    Wey, I-Chyn ; Chen, You-Gang ; Yu, Changhong ; Chen, Jie ; Wu, An-Yeu Andy

  • Author_Institution
    Nat. Taiwan Univ., Taipei
  • fYear
    2006
  • fDate
    13-15 Nov. 2006
  • Firstpage
    291
  • Lastpage
    294
  • Abstract
    As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the injected noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. In this paper, we design and implement an 8-bit Markov random field carry lookahead adder (MRFCLA) probabilistic-based noise-tolerant circuit in 0.18μm CMOS process technology. This is the first working silicon design to prove the design concept of the noise-tolerant MRF circuits. The measurement results show that the proposed of the MRF adder can provide 28.7dB of noise-immunity as compared with its conventional CMOS design, when both circuits are facing the same server SNR environment. The MRF adder circuit can also achieve 10-6 BER when the supply voltage is only 0.45 V and SNR is only 10 dB.
  • Keywords
    CMOS logic circuits; Markov processes; VLSI; adders; carry logic; integrated circuit design; integrated circuit noise; BER; CMOS device; Markov random field carry lookahead adder; VLSI circuit; bit error rate; nanoscale level; noise interference; noise-immunity; probabilistic-based noise-tolerate circuit design; size 0.18 μm; very large scale integration; voltage 0.45 V; Adders; Circuit noise; Circuit optimization; Circuit synthesis; Interference; Markov random fields; Nanoscale devices; Noise level; Very large scale integration; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2006. ASSCC 2006. IEEE Asian
  • Conference_Location
    Hangzhou
  • Print_ISBN
    0-7803-9734-7
  • Electronic_ISBN
    0-7803-97375-5
  • Type

    conf

  • DOI
    10.1109/ASSCC.2006.357908
  • Filename
    4197647