Title :
Hybrid silicon and glass interposer for combined optical and memory system-in-package
Author :
Uematsu, Y. ; Toyama, M. ; Yorita, C. ; Osaka, H.
Author_Institution :
Yokohama Res. Lab., Hitachi Ltd., Yokohama, Japan
Abstract :
This paper proposes a low-cost packaging configuration for a combined optical and memory system-in-package. The proposed hybrid silicon and glass configuration meets the wiring density required for HBM and high-frequency characteristics required for optical IC wiring. We also built and tested a wiring TEG to evaluate the high-frequency performance of 25 Gbps differential transmission wiring for optical ICs in the glass interposer region, thereby seeking to minimize losses and reduce power consumption. Experiments showed satisfactory transfer characteristics of □0.8 dB/cm.
Keywords :
integrated circuit interconnections; integrated circuit testing; system-in-package; HBM; bit rate 25 Gbit/s; combined optical and memory system-in-package; differential transmission wiring; glass interposer region; high-frequency characteristics; hybrid silicon and glass configuration; low-cost packaging configuration; optical IC wiring; wiring TEG; wiring density; Glass; High-speed optical techniques; Integrated circuits; Integrated optics; Optical fibers; Wiring; 2.5-D integration; Silicon interposer; System in Package; glass interposer;
Conference_Titel :
Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2014 IEEE
Conference_Location :
Bangalore
DOI :
10.1109/EDAPS.2014.7030801