Title :
Calculation of the Shapiro step amplitudes in two-dimensional Josephson tunnel junctions (voltage standard)
Author :
Klein, U. ; Schroder, S. ; Hinken, J.H.
Author_Institution :
Inst. of High-Frequency Eng., Tech. Univ. of Braunschweig, Germany
Abstract :
The amplitudes of RF-induced constant voltage steps in two-dimensional Josephson tunnel junctions is investigated theoretically using a first-order approximation of the current density distributions in the junction. A planar resonator model is used to analyze the electromagnetic field in the microwave-driven junction. It is found that the power dependence of the Shapiro step height in two-dimensional resonant junctions is different from that in one-dimensional junctions. The maximum amplitude is lower, and the microwave amplitude, which is needed to reach the maximum step height, is increased. The step amplitude oscillates with increasing power, but it does not reach zero. The smooth curve of the step amplitude near its maximum gives a wide microwave power region of sufficiently high step amplitudes in two-dimensional junctions.<>
Keywords :
Josephson effect; measurement standards; resonators; superconducting junction devices; voltage measurement; RF-induced constant voltage steps; Shapiro step amplitudes; current density distributions; electromagnetic field; first-order approximation; microwave amplitude; microwave-driven junction; planar resonator model; power dependence; resonant junctions; smooth curve; two-dimensional Josephson tunnel junctions; voltage standard; Current density; Electromagnetic fields; Josephson effect; Josephson junctions; Maxwell equations; Microwave antenna arrays; Partial differential equations; Resonance; Resonant frequency; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CPEM.1990.109948
