DocumentCode :
2561408
Title :
Modeling thermally induced viscoplastic deformation and low cycle fatigue of CBGA solder joints in a surface mount package
Author :
Hong, Bot Zen ; Burrell, Lloyd G.
Author_Institution :
Microelectron. Div., IBM Corp., Hopewell Junction, NY, USA
fYear :
1996
fDate :
29 May-1 Jun 1996
Firstpage :
158
Lastpage :
165
Abstract :
A nonlinear finite element model was used to analyze the thermally induced viscoplastic deformation and low cycle fatigue behavior of the lead-tin (Pb-Sn) solder joints in a 32mm ceramic ball grid array (CBGA) surface mount package. The effects of the cyclic frequency, hold (dwell) time, and temperature ramp rate on the response of the the viscoplastic (creep and plastic) deformation for the CBGA solder joints were studied by applying four different low cycle thermal fatigue loads to the package. The modeling results show that the maximum viscoplastic strains occur in and around the edge CBGA solder joint. The cyclic creep strain (ratchetting) is very significant and dominates the constituent of the accumulated viscoplastic strain. The equivalent plastic strain increases with the increase of cyclic frequency and ramp rate, and decreases as the hold time increases. However, the equivalent creep strain decreases with the increase of cyclic frequency and ramp rate, but increases as the hold time increases. In the solder joint, the Pb37-Sn63 solder paste has approximately 2× larger equivalent plastic strains, and 10× larger equivalent creep strains than that in the Pb90-Sn10 solder ball during thermal cycling
Keywords :
creep; fatigue; finite element analysis; integrated circuit packaging; modelling; plastic deformation; soldering; surface mount technology; thermal stress cracking; BGA package; CBGA solder joints; Pb-Sn; Pb-Sn solder joints; SMT; ceramic ball grid array; creep deformation; cyclic creep strain; cyclic frequency; dwell time; low cycle fatigue; nonlinear finite element model; plastic deformation; ratchetting; surface mount package; temperature ramp rate; thermal cycling; thermally induced viscoplastic deformation; Capacitive sensors; Creep; Deformable models; Fatigue; Finite element methods; Frequency; Lead; Packaging; Plastics; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1996. I-THERM V., Inter-Society Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3325-X
Type :
conf
DOI :
10.1109/ITHERM.1996.534557
Filename :
534557
Link To Document :
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