Title :
Experimental studies of silicon nitride waveguides fabrication
Author :
Kusko, Mihai ; Avram, Andrei ; Dinescu, Adrian ; Kusko, Cristian ; Comanescu, Florin ; Iorga, Carmen ; Muller, Raluca
Author_Institution :
Nat. Inst. for R&D in Microtechnol. (IMT), Bucharest, Romania
Abstract :
In this paper are summarized the results of the experimental studies regarding the fabrication of silicon nitride waveguides with applications in biosensing. The waveguides have been fabricated with electron beam lithography and reactive ion etching using PMMA and metallic mask, respectively. Surface quality after etching process and the etching rate are evaluated with characterization tools like AFM, SEM and optical thin film metrology. From our studies we conclude that the use of a metallic mask is beneficial for obtaining high quality waveguides with small dimensions.
Keywords :
atomic force microscopy; electron beam lithography; optical fabrication; optical films; optical waveguides; scanning electron microscopy; silicon compounds; sputter etching; thin films; AFM; PMMA mask; SEM; Si3N4; electron beam lithography; metallic mask; optical thin film metrology; reactive ion etching; silicon nitride waveguide fabrication; surface quality; Etching; Optical device fabrication; Optical waveguides; Silicon; Surface waves; Reactive Ion Etching; Waveguides;
Conference_Titel :
Semiconductor Conference (CAS), 2011 International
Conference_Location :
Sinaia
Print_ISBN :
978-1-61284-173-1
DOI :
10.1109/SMICND.2011.6095719