DocumentCode :
2561721
Title :
Complete scheme for beam hardening correction in small animal computed tomography
Author :
de Molina, C. ; Sisniega, A. ; Vaquero, J.J. ; Desco, M. ; Abella, M.
Author_Institution :
Dept. de Bioing. e lng. Aerosp., Univ. Carlos III de Madrid, Leganés, Spain
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
3835
Lastpage :
3838
Abstract :
CT images are often affected by beam hardening artifacts due to the polyenergetic nature of the X-ray beam. Several correction methods have been proposed to be included in an FDK reconstruction scheme, which is still the prefered reconstruction algorithm in commercial X-ray CT scanners. In this work, we present a complete correction scheme for beam hardening artifact correction in an FDK-based reconstruction scenario that accounts for both cupping artifact and dark streaks. The proposed method substitutes the need of the knowledge of the spectrum by empirical measurements and two parameters. It includes two steps: a linearization step of projection data and a post-reconstruction step. Evaluation done in real studies acquired with a cone-beam micro-CT scanner showed an average cupping reduction of 80% in homogeneous phantoms and 72% in rodent studies. The correction scheme can be incorporated easily in any cone beam micro-CT scanner.
Keywords :
computerised tomography; diagnostic radiography; image reconstruction; medical image processing; phantoms; CT images; FDK reconstruction scheme; X-ray CT scanners; X-ray beam; average cupping reduction; beam hardening artifacts; beam hardening correction scheme; cone-beam microCT scanner; cupping artifact; dark streaks; empirical measurements; homogeneous phantoms; linearization step; polyenergetic nature; post-reconstruction step; projection data; reconstruction algorithm; small animal computed tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551880
Filename :
6551880
Link To Document :
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