DocumentCode
2561738
Title
Numerical simulation of charge exchange ions´ affect in ion extraction for ion optics
Author
Yuchuan Chu ; Yong Cao
Author_Institution
Dept. of Mech. Eng. & Autom., Harbin Inst. of Technol., Shenzhen, China
fYear
2012
fDate
8-13 July 2012
Abstract
Summary form only given. A three-dimensional code is developed to investigate the characteristics of the ion extraction systems for ion optical system. Charge-exchange (CEX) ions play a profound role in the failure of ion thrusters due to erosion of the accelerator grid. Immersed finite elements (IFE) and particle in cell methods are adopted to simulate the motion of ions. Numerical simulation represents the accelerator-grid impingement pattern and the beamlet profile on the accelerator grid. In order to accurately represent the neutral number density which is critical to CEX ion production rate and deduce the magnitude of background effects, background gas has been added to the simulation case in this paper for comparison. It is shown that the accelerator-grid impingement-current characteristics which take CEX affect into account agree well with the experiment result.
Keywords
charge exchange; ion optics; plasma accelerators; plasma simulation; 3D code; CEX ion production rate; IFE; accelerator grid impingement pattern; background gas; beamlet profile; charge exchange ions; immersed finite elements; ion extraction; ion optics; ion thrusters; neutral number density; particle in cell methods; Acceleration; Automation; Educational institutions; Finite element methods; Mechanical engineering; Numerical simulation; Particle beam optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
Conference_Location
Edinburgh
ISSN
0730-9244
Print_ISBN
978-1-4577-2127-4
Electronic_ISBN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2012.6383735
Filename
6383735
Link To Document