• DocumentCode
    2561830
  • Title

    Ultra-shallow Carborane molecular implant for 22-nm node p-MOSFET performance boost

  • Author

    Colombeau, B. ; Thanigaivelan, T. ; Arevalo, E. ; Toh, T. ; Miura, R. ; Ito, H.

  • Author_Institution
    Varian Semicond. Equip. Assoc., Inc., Gloucester, MA, USA
  • fYear
    2009
  • fDate
    11-12 June 2009
  • Firstpage
    27
  • Lastpage
    30
  • Abstract
    In this paper, for the first time, Carborane molecular implant is shown to provide performance boost applicable for both 22 nm Low Power and High Performance applications. The impact of ultra-shallow Carborane incorporation into pMOS S/D-extension was investigated. It was found that the activation of surface Boron was enhanced by the ultra-shallow carbon incorporation inherent to the Carborane molecule. PMOS Transistor characteristics demonstrate that drive current, short channel effect, overlap capacitance as well as leakage are significantly improved by the chemical and physical effects of the Carborane molecule.
  • Keywords
    MOSFET; boron; carbon; B; Ca; PMOS transistor; p-MOSFET performance boost; pMOS S/D-extension; size 22 nm; surface Boron; ultra-shallow Carborane molecular implant; Annealing; Boron; CMOS technology; Capacitance; Chemicals; High K dielectric materials; Implants; Ion implantation; MOSFET circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology, 2009. IWJT 2009. International Workshop on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-3319-3
  • Electronic_ISBN
    978-1-4244-3320-9
  • Type

    conf

  • DOI
    10.1109/IWJT.2009.5166211
  • Filename
    5166211