DocumentCode
2561830
Title
Ultra-shallow Carborane molecular implant for 22-nm node p-MOSFET performance boost
Author
Colombeau, B. ; Thanigaivelan, T. ; Arevalo, E. ; Toh, T. ; Miura, R. ; Ito, H.
Author_Institution
Varian Semicond. Equip. Assoc., Inc., Gloucester, MA, USA
fYear
2009
fDate
11-12 June 2009
Firstpage
27
Lastpage
30
Abstract
In this paper, for the first time, Carborane molecular implant is shown to provide performance boost applicable for both 22 nm Low Power and High Performance applications. The impact of ultra-shallow Carborane incorporation into pMOS S/D-extension was investigated. It was found that the activation of surface Boron was enhanced by the ultra-shallow carbon incorporation inherent to the Carborane molecule. PMOS Transistor characteristics demonstrate that drive current, short channel effect, overlap capacitance as well as leakage are significantly improved by the chemical and physical effects of the Carborane molecule.
Keywords
MOSFET; boron; carbon; B; Ca; PMOS transistor; p-MOSFET performance boost; pMOS S/D-extension; size 22 nm; surface Boron; ultra-shallow Carborane molecular implant; Annealing; Boron; CMOS technology; Capacitance; Chemicals; High K dielectric materials; Implants; Ion implantation; MOSFET circuits; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Junction Technology, 2009. IWJT 2009. International Workshop on
Conference_Location
Kyoto
Print_ISBN
978-1-4244-3319-3
Electronic_ISBN
978-1-4244-3320-9
Type
conf
DOI
10.1109/IWJT.2009.5166211
Filename
5166211
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