Title :
Silicon nitride microdisks in the visible range
Author :
McCloskey, D. ; Donegan, John F.
Author_Institution :
Sch. of Phys., Trinity Coll. Dublin, Dublin, Ireland
Abstract :
We fabricate microdisks from Silicon Nitride (Si3N4) on a silica (SiO2) substrate using a simple e-beam lithography and inductively coupled plasma (ICP) etching process. The method results in production of a large number of resonators in a quick and reproducible fashion. The Si3N4 exhibits an intrinsic broad defect emission across the visible range. We use this luminescence to probe the resonance structure of the microdisks using micro-photoluminescence (PL) spectroscopy. Together this provides a quick method to fabricate and characterise the microdisk structures. We are interested in small disks with diameters ranging 1 - 10 μm. These disks exhibit modes of reasonable quality factor (Q) dominated by radiative loss. This fabrication process will allow a fast method to study coupling in photonic molecule systems in the visible range. In this paper we demonstrate the feasibility of this method to produce adequately size matched microdisks for mode coupling experiments. We determine the optimum disk size and examine the variation of FSR and Q factor with disk diameter.
Keywords :
Q-factor; electron beam lithography; luminescence; micro-optics; optical fabrication; silicon compounds; sputter etching; visible spectra; visible spectroscopy; Si3N4; SiO2; broad defect emission; electron beam lithography; inductively coupled plasma etching; microphotoluminescence spectroscopy; mode coupling; photonic molecule systems; quality factor; radiative loss; silicon nitride microdisks; size 1 mum to 10 mum; visible range; Couplings; Integrated optics; Optical resonators; Optical variables measurement; Photonics; Q factor; Silicon; Photoluminescence spectroscopy; micro-disks; micro-resonators; photonic molecules;
Conference_Titel :
Transparent Optical Networks (ICTON), 2011 13th International Conference on
Conference_Location :
Stockholm
Print_ISBN :
978-1-4577-0881-7
Electronic_ISBN :
2161-2056
DOI :
10.1109/ICTON.2011.5971052