• DocumentCode
    2562198
  • Title

    Evidence that degradation in a-Si:H solar cells is an i layer effect

  • Author

    Redfield, David ; Bube, Richard H.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Stanford Univ., CA, USA
  • fYear
    1991
  • fDate
    7-11 Oct 1991
  • Firstpage
    1319
  • Abstract
    Information has been obtained on light-induced degradation and annealing in a-Si:H by the use of homogeneous films, not solar cells. This study summarizes these advances and compares them with data on corresponding effects in cells. This comparison provides consistent evidence that cell degradation can be inferred from the properties of bulk defect generation in films. This evidence comes from anneal kinetics, the existence and properties of saturation, degradation kinetics, thickness dependence of degradation, and performance modeling of films and cells. There seems to be no substantial evidence that cell properties are degraded seriously by other effects. Thus, film properties can be generally used as guides for cell stability
  • Keywords
    amorphous semiconductors; annealing; elemental semiconductors; hydrogen; silicon; solar cells; amorphous Si:H solar cells; anneal kinetics; annealing; bulk defect generation; degradation kinetics; homogeneous films; light-induced degradation; performance modeling; semiconductor; stability; thickness dependence; Annealing; Degradation; Kinetic theory; Materials science and technology; Metastasis; Photovoltaic cells; Solar power generation; Stability; Steady-state; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-87942-636-5
  • Type

    conf

  • DOI
    10.1109/PVSC.1991.169421
  • Filename
    169421