DocumentCode :
2562359
Title :
Sequential sampling plans for early-life reliability assessment
Author :
Chan, Chun Kin ; Seraidaridia, C.I. ; Tortorella, Michael
Author_Institution :
Bell Labs., Lucent Technol., Whippany, NJ, USA
fYear :
1997
fDate :
13-16 Jan 1997
Firstpage :
131
Lastpage :
135
Abstract :
This paper proposes a method for demonstrating early life reliability by combining environmental stress screening strength models and Wald´s sequential test for equipment whose early life reliability is described by a Weibull distribution of time to failure. The proposed method uses screening strength models to transform an environmental stress test (e.g. temperature cycling/random vibration) to an equivalent constant heat test. This transformation gives an equivalent number of field operating hours which can then be used together with the Weibull model of early-life reliability to compute the accept and reject boundaries of Wald´s sequential test plan. This method helps an equipment supplier decide whether a product meets a customer´s requirement of early-life reliability
Keywords :
Weibull distribution; environmental stress screening; failure analysis; life testing; reliability theory; Wald´s sequential test; Weibull distribution; early-life reliability assessment; environmental stress screening strength models; equivalent constant heat test; field operating hours; random vibration; sequential sampling plans; temperature cycling; time to failure; Accelerated aging; Acceleration; Life testing; Sampling methods; Sequential analysis; Steady-state; Telecommunication computing; Temperature distribution; Thermal stresses; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium. 1997 Proceedings, Annual
Conference_Location :
Philadelphia, PA
ISSN :
0149-144X
Print_ISBN :
0-7803-3783-2
Type :
conf
DOI :
10.1109/RAMS.1997.571682
Filename :
571682
Link To Document :
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