Abstract :
The following topics on integrated circuit design and technology are dealt with: low power design; ESD; high power design; computer aided design; plasma induced damage; soft errors; system-on-chips; advance transistors; semiconductor storage; design for manufacture, design for testability, design for recycling, and design for yield; and RF analog integrated circuits.
Keywords :
analogue integrated circuits; design for disassembly; design for manufacture; design for testability; electrostatic discharge; integrated circuit technology; integrated circuit testing; integrated circuit yield; radiation hardening (electronics); radiofrequency integrated circuits; semiconductor storage; semiconductor technology; system-on-chip; transistors; ESD; RF analog integrated circuit; advance transistor; computer aided design; design for manufacture; design for recycling; design for testability; design for yield; integrated circuit design; integrated circuit technology; plasma induced damage; semiconductor storage; soft error; system-on-chips;
Conference_Titel :
IC Design and Technology, 2009. ICICDT '09. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2933-2
Electronic_ISBN :
978-1-4244-2934-9
DOI :
10.1109/ICICDT.2009.5166241
