DocumentCode :
2562446
Title :
Effects of Cr content on the interruption ability of CuCr contact materials
Author :
Li, W.P. ; Thomas, R.L. ; Smith, R.K.
Author_Institution :
Cutler-Hammer, Horseheads, NY, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
380
Abstract :
The effects of Cr content in CuCr contact materials, especially on high current interruption, have so far mostly been examined in experimental chambers rather than in actual vacuum interrupters (VIs). Possible interactions of the contacts with their surroundings, both electromechanical and gaseous, may require commercial VIs for a more realistic test determination of the effects of Cr content on the overall performance. In this work, the Cr content in CuCr contacts is varied from 5 to 75 wt% and tested in their 38 kV axial magnetic field type VIs. The material properties of electrical conductivity, hardness and total VI resistance are measured as a function of the Cr content. AC and impulse voltage withstand capabilities are tested before and after short-circuit current interruption tests. Contact erosion behavior is examined with VIs subjected to only a half cycle arcing duty
Keywords :
chromium alloys; copper alloys; electrical contacts; magnetic fields; short-circuit currents; switchgear testing; vacuum interrupters; 38 kV; AC voltage withstand capability; CuCr; CuCr contact materials; axial magnetic field; contact erosion behavior; electrical conductivity; half cycle arcing duty; hardness; impulse voltage withstand capability; interruption ability; material properties; performance testing; short-circuit current interruption; total resistance; vacuum interrupters; Chromium; Conductivity measurement; Contacts; Electric resistance; Electric variables measurement; Electrical resistance measurement; Impulse testing; Interrupters; Magnetic field measurement; Material properties;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2000. Proceedings. ISDEIV. XIXth International Symposium on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5791-4
Type :
conf
DOI :
10.1109/DEIV.2000.879007
Filename :
879007
Link To Document :
بازگشت