DocumentCode
2562526
Title
A novel edge protective adaptive filter for high energy X-ray imaging technology
Author
Yi Wang ; Xuezhong Qiu ; Xingming Fan ; Yongshun Xiao ; Yuanjing Li
Author_Institution
Dept. of Eng. Phys., Tsinghua Univ., Beijing, China
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
4036
Lastpage
4039
Abstract
Impulse noise will greatly influence the quality of images in high energy X-ray imaging. This paper concludes the properties of impulse noise, proposes a probability model and a spatial model of impulse noise and realizes the computer simulation of impulse noise. In order to effectively eliminate impulse noise, an edge protective adaptive median (EP AM) filter is proposed according to the properties of impulse noise. EP AM filter classifies pixels into extreme noise, corrupted pixels and uncorrupted pixels and use different filters for different pixels. With the purpose of protecting the image edge, an edge detection algorithm embedded in EP AM filter is proposed. The determination of extreme noise in edges is stricter than in smooth areas. Through experiments, this method proves to be effective in the denoising of isolated, non-isolated impulse noise. In comparison with standard median (SM), adaptive median (AM), wavelet thresholding and center weighted median (CWM) filters, our method has superior performance when noise density ranges from 0.1 to 0.9. It produces satisfactory result when applied to high energy X-ray images with impulse noise.
Keywords
X-ray imaging; adaptive filters; edge detection; image reconstruction; impulse noise; median filters; CWM filter; EP AM filter; SM; center weighted median filter; computer simulation; edge protective adaptive median filter; high energy X-ray imaging technology; noise density; nonisolated impulse noise; probability model; spatial model; standard median; wavelet thresholding filter; adaptive median filter; edge detection; impulse noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551923
Filename
6551923
Link To Document