Title :
Electron and proton irradiation of GaSb infrared solar cells
Author :
Gruenbaum, P.E. ; Avery, J.E. ; Fraas, L.M.
Author_Institution :
Boeing High Technol. Center, Seattle, WA, USA
Abstract :
Gallium antimonide (GaSb) infrared solar cells were exposed to 1 MeV electrons and 0.2-1 MeV protons up to fluences of 1×1015 cm-2 and 1×1012 cm-2 respectively. In between exposures, current-voltage and spectral response curves were taken. The GaSb cells were found to degrade slightly less than typical GaAs cells under electron irradiation, and calculations from spectral response curves showed that the damage coefficient for the minority carrier diffusion length was 3.5×10 -8. The cells degraded faster than GaAs cells under proton irradiation, but the top cell and coverglass are expected to protect the GaSb cell from most damaging protons. Some annealing of proton damage was observed at low temperatures (80-160°C)
Keywords :
III-V semiconductors; gallium compounds; semiconductor device testing; solar cells; 0.2 to 1 MeV; 1 MeV; 80 to 160 degC; GaSb; I-V characteristics; annealing; damage coefficient; degradation; electron irradiation; infrared solar cells; minority carrier diffusion length; proton irradiation; semiconductor device testing; spectral response; Annealing; Assembly; Degradation; Electrons; Filters; Gallium arsenide; Gallium compounds; Photovoltaic cells; Protons; Silicon;
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
DOI :
10.1109/PVSC.1991.169443