The effect of low energy protons on silicon solar cells with simulated coverglass cracks

Author

Gasner, S. ; Anspaugh, B. ; Francis, R. ; Marvin, D.

Author_Institution

Lockheed Missiles & Space Co., Sunnyvale, CA, USA

fYear

1991

fDate

7-11 Oct 1991

Firstpage

1457

Abstract

Results of a series of low-energy proton (LEP) tests are presented. The purpose of the tests was to investigate the effect of low-energy protons on the electrical performance of solar cells with simulated cracked covers. The results of the tests were then related to the space environment. A matrix of LEP tests was set up using solar cells with simulated cracks to determine the effect on electrical performance as a function of fluence, energy, crack width, coverglass adhesive shielding, crack location, and solar cell size. The results of the test were, for the most part, logical, and consistent

Keywords

aerospace testing; elemental semiconductors; semiconductor device testing; silicon; solar cells; space vehicle power plants; Si; adhesive shielding; aerospace testing; coverglass cracks; crack location; crack width; electrical performance; energy; fluence; low energy protons; semiconductor device testing; solar cells; space power; Aerospace testing; Degradation; Laboratories; Logic testing; Missiles; Orbits; Photovoltaic cells; Propulsion; Protons; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE

Conference_Location

Las Vegas, NV

Print_ISBN

0-87942-636-5

Type

conf

DOI

10.1109/PVSC.1991.169446

Filename

169446