Title :
Dislocations and defect structure around micro-indentations and Te precipitates in CdTe
Author :
Babentsov, V. ; Sizov, F. ; Franc, Jan ; Fochuk, Petro ; Yang, Guo-Min ; Bolotnikov, Alexander ; James, Ralph B.
Author_Institution :
Inst. for Semicond. Phys., Kiev, Ukraine
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
We investigated dislocation-related electronic states induced by dislocation motion in CdTe-based semiconductors. Dislocations cause various types of electronic defect states in the bandgap of semiconductors, namely, defects created by different types of dislocations, and those due to an impurity or native defect segregated around the dislocations. The aim of this work was to further clarify, on the basis of an analysis of the lattice deformation, whether these defects belong to either the Te or Cd sublattice and to formulate a model describing such defects.
Keywords :
II-VI semiconductors; cadmium compounds; crystal structure; deformation; dislocation motion; energy gap; indentation; precipitation (physical chemistry); segregation; semiconductor counters; tellurium compounds; Cd sublattice; CdTe-based semiconductors; CeTe; Te precipitates; Te sublattice; bandgap; defect structure; dislocation motion; dislocation-related electronic states; electronic defect states; lattice deformation; microindentations; native defect;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551943