DocumentCode :
2562879
Title :
Dislocations and defect structure around micro-indentations and Te precipitates in CdTe
Author :
Babentsov, V. ; Sizov, F. ; Franc, Jan ; Fochuk, Petro ; Yang, Guo-Min ; Bolotnikov, Alexander ; James, Ralph B.
Author_Institution :
Inst. for Semicond. Phys., Kiev, Ukraine
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
4128
Lastpage :
4130
Abstract :
We investigated dislocation-related electronic states induced by dislocation motion in CdTe-based semiconductors. Dislocations cause various types of electronic defect states in the bandgap of semiconductors, namely, defects created by different types of dislocations, and those due to an impurity or native defect segregated around the dislocations. The aim of this work was to further clarify, on the basis of an analysis of the lattice deformation, whether these defects belong to either the Te or Cd sublattice and to formulate a model describing such defects.
Keywords :
II-VI semiconductors; cadmium compounds; crystal structure; deformation; dislocation motion; energy gap; indentation; precipitation (physical chemistry); segregation; semiconductor counters; tellurium compounds; Cd sublattice; CdTe-based semiconductors; CeTe; Te precipitates; Te sublattice; bandgap; defect structure; dislocation motion; dislocation-related electronic states; electronic defect states; lattice deformation; microindentations; native defect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551943
Filename :
6551943
Link To Document :
بازگشت