DocumentCode :
2563004
Title :
The modified exponentiated-Weibull distribution for life-time modeling
Author :
Gera, Amos E.
Author_Institution :
ELTA Electron. Ind. Ltd., Ashdod, Israel
fYear :
1997
fDate :
13-16 Jan 1997
Firstpage :
149
Lastpage :
152
Abstract :
The so-called “exponentiated Weibull distribution” has been offered as a simple generalization of the Weibull distribution. It is well suited for modeling bathtub failure rate lifetime data. A modified version of this distribution is presented to meet the problem of bandlimited input data on failure times. This is seen to yield a more pessimistic MTBF value which is more realistic in case of lack of information. The use of the new distribution for lifetime modeling of a bathtub type distribution is demonstrated using experimental data. A closed form series expansion is also supplied to exhibit the dependence of the MTBF upon the parameters of the distribution. This is shown to yield an upper bound on the value of the MTBF. In some cases it may serve as an efficient approximation for its evaluation
Keywords :
Weibull distribution; failure analysis; reliability theory; MTBF value; bandlimited input data; bathtub failure rate modelling; failure times; life-time modeling; modified exponentiated-Weibull distribution; Aging; Bandwidth; Data analysis; Exponential distribution; Hazards; Integral equations; Maximum likelihood estimation; Shape; Upper bound; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium. 1997 Proceedings, Annual
Conference_Location :
Philadelphia, PA
ISSN :
0149-144X
Print_ISBN :
0-7803-3783-2
Type :
conf
DOI :
10.1109/RAMS.1997.571690
Filename :
571690
Link To Document :
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