• DocumentCode
    2563304
  • Title

    An external circuit model for electromagnetic particle-in-cell simulations

  • Author

    Lin, M.C. ; Zhou, C.D. ; Smithe, David N.

  • Author_Institution
    Tech-X Corp., Boulder, CO, USA
  • fYear
    2012
  • fDate
    8-13 July 2012
  • Abstract
    Summary form only given. In general, the operating characteristics of RF vacuum electronic or plasma devices are affected by the power supply, e.g., a pushing effect on the oscillating frequency of a magnetron by a supplied anode current. The external impedance connected to the system under study should be included in the electromagnetic (EM) particle-in-cell (PIC) simulations especially when the system is in a transient state or characterized with a dynamic impedance. In this work, an algorithm for coupling external circuit elements to EM PIC simulations is developed. The circuit equation including an external voltage Vs or current source Is, resistance R, inductance L, capacitance C, and the dynamic load (I-V) is solved simultaneously with the EM PIC updaters through an instant measured voltage V across the system to obtain the supplied current I for feeding into the system. This external circuit model is under testing and will be implemented in a 3D conformal finite-difference time-domain PIC code, VORPAL.
  • Keywords
    finite difference time-domain analysis; plasma oscillations; plasma simulation; vacuum microelectronics; 3D conformal finite-difference time-domain PIC code; EM PIC updaters; RF vacuum electronic devices; VORPAL; algorithm; coupling external circuit elements; dynamic impedance; electromagnetic particle-in-cell simulations; external circuit model; external impedance; magnetron; oscillating frequency; plasma devices; supplied anode current; transient state; Electromagnetics; Impedance; Integrated circuit modeling; Load modeling; Mathematical model; Plasmas; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
  • Conference_Location
    Edinburgh
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4577-2127-4
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2012.6383818
  • Filename
    6383818