Title :
The representation of the ohm using the quantum Hall effect at IEN
Author :
Boella, G. ; Marullo Reedtz, G.
Author_Institution :
IEN Galileo Ferraris, Torino, Italy
Abstract :
A method to measure the quantized Hall resistance (QHR) in terms of the Istituto Elettrotecnico Nazionale (IEN), Italy, reference standard is described. Measurements showing the independence of QHR from the experimental conditions are reported. A preliminary evaluation of the difference between Omega /sub IEN/ and the new quantum-Hall-based standard is given.<>
Keywords :
electric resistance measurement; measurement standards; quantum Hall effect; units (measurement); IEN; Istituto Elettrotecnico Nazionale; Italy; electric resistance standard; quantum Hall effect; reference standard; Electrical resistance measurement; Electrons; Hall effect; Humidity; Insulation; Magnetic field measurement; Magnetic flux density; Measurement standards; Resistors; Testing;
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CPEM.1990.110051
