DocumentCode
2563545
Title
The representation of the ohm using the quantum Hall effect at IEN
Author
Boella, G. ; Marullo Reedtz, G.
Author_Institution
IEN Galileo Ferraris, Torino, Italy
fYear
1990
fDate
11-14 June 1990
Firstpage
340
Lastpage
341
Abstract
A method to measure the quantized Hall resistance (QHR) in terms of the Istituto Elettrotecnico Nazionale (IEN), Italy, reference standard is described. Measurements showing the independence of QHR from the experimental conditions are reported. A preliminary evaluation of the difference between Omega /sub IEN/ and the new quantum-Hall-based standard is given.<>
Keywords
electric resistance measurement; measurement standards; quantum Hall effect; units (measurement); IEN; Istituto Elettrotecnico Nazionale; Italy; electric resistance standard; quantum Hall effect; reference standard; Electrical resistance measurement; Electrons; Hall effect; Humidity; Insulation; Magnetic field measurement; Magnetic flux density; Measurement standards; Resistors; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location
Ottawa, Ontario, Canada
Type
conf
DOI
10.1109/CPEM.1990.110051
Filename
110051
Link To Document