DocumentCode :
2563626
Title :
Finite element transient thermal analysis of electronic boards and packages using moment-matching techniques
Author :
Phanilatha, V. ; Nakhla, Michel S. ; Zhang, Qi-Jun ; Liu, Da-Guang
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
fYear :
1996
fDate :
29 May-1 Jun 1996
Firstpage :
391
Lastpage :
398
Abstract :
Development of highly integrated and denser semiconductor module configurations with greater power consumption rates make thermal design increasingly important. In this paper a new solution method for transient thermal analysis of electronic systems is described. The method is based on combining finite element technique and efficient moment-matching technique originally developed in the circuit simulation area for solving large set of linear differential equations. Finite element modeling in space/time domain of a complete electronic system usually results in a large set of ordinary differential equations which can be solved using various time stepping algorithms. However, efficiency of conventional algorithms is limited by their computational cost and stability criteria. In this paper, application of the moment-matching technique to solve thermal finite element equations is presented. Several examples are considered to illustrate the methodology. A good agreement between the results obtained using conventional iterative techniques and the proposed method has been found. In addition, applying moment-matching technique results in one to two orders of magnitude speed-up compared to conventional iterative techniques
Keywords :
circuit stability; finite element analysis; linear differential equations; method of moments; packaging; printed circuit layout; thermal analysis; thermal stability; transient analysis; computational cost; electronic boards; electronic packages; finite element modeling; finite element transient thermal analysis; linear differential equations; moment-matching techniques; power consumption rates; semiconductor module configurations; space/time domain modelling; stability criteria; thermal design; Circuit simulation; Costs; Differential equations; Electronic packaging thermal management; Finite element methods; Geometry; Laplace equations; Tellurium; Thermal conductivity; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1996. I-THERM V., Inter-Society Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3325-X
Type :
conf
DOI :
10.1109/ITHERM.1996.534587
Filename :
534587
Link To Document :
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